Forensic document examination discussed

– Photo by John Meiu


The Polish American Legal Society recently hosted a general meeting at the Polish Village Café in Hamtramck featuring guest speaker Todd Welch (center) of Riley, Welch, LaPorte & Associates. Welcoming Welch to the meeting were (left to right) Michael Dean, Jim Makowski, William Jurczak, Brian Hill, Doug Hamel and Angela Marino. In addition to running a law practice, Welch works at the State Police crime lab as a forensic document examiner. He said he planned during his presentation to talk about “the substantial amount of forensic evidence contained within documents that most attorneys are never aware of, in both civil and criminal matters.

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